A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara
—Large, fast switches require novel approaches to architecture and scheduling. In this paper, we propose the Output Buffered Switch with Input Groups (OBIG). We present simulatio...
This paper reports on an exploratory study of the effects of input configuration on group behavior and performance in a collaborative task performed by a collocated group using a ...
Jeremy P. Birnholtz, Tovi Grossman, Clarissa Mak, ...
We envisage pervasive computing applications to be predominantly engaged in knowledge-based interactions, where services and information will be found and exchanged based on some ...