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CSREAESA
2008
14 years 11 months ago
BIST-BASED Group Testing for Diagnosis of Embedded FPGA Cores
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara
GLOBECOM
2007
IEEE
15 years 3 months ago
OBIG: the Architecture of an Output Buffered Switch with Input Groups for Large Switches
—Large, fast switches require novel approaches to architecture and scheduling. In this paper, we propose the Output Buffered Switch with Input Groups (OBIG). We present simulatio...
Wladek Olesinski, Hans Eberle, Nils Gura
CHI
2007
ACM
15 years 1 months ago
An exploratory study of input configuration and group process in a negotiation task using a large display
This paper reports on an exploratory study of the effects of input configuration on group behavior and performance in a collaborative task performed by a collocated group using a ...
Jeremy P. Birnholtz, Tovi Grossman, Clarissa Mak, ...
PERCOM
2007
ACM
15 years 9 months ago
MaLM: Machine Learning Middleware to Tackle Ontology Heterogeneity
We envisage pervasive computing applications to be predominantly engaged in knowledge-based interactions, where services and information will be found and exchanged based on some ...
Licia Capra