: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
We present a polynomial upper bound for flattening of UML statecharts. An efficient flattening technique is derived and implemented in SCOPE—a code generator targeting constra...
We describe a system for gathering and analyzing Java trace data. The system provides relatively complete data collection from large Java systems. It also provides a variety of di...
Solution symmetries in integer linear programs often yield long Branch-and-Bound based solution processes. We propose a method for finding elements of the permutation group of sol...
Abstract. Generational collectors are well known as a tool for shortening pause times incurred by garbage collection and for improving garbage collection efficiency. In this paper,...