3736 search results - page 531 / 748 » Hand-Writing Program Generator Generators |
162
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ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
Leakage current is a key factor in IC power consumption even in the active operating mode. We investigate the simultaneous optimization of gate size and threshold voltage to reduc...
180
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ICCD
2002
IEEE
16 years 3 months ago
2002
IEEE
— In this paper, we present a new interconnect delay model called Fitted Elmore delay (FED). FED is generated by approximating Hspice delay data using a curve fitting technique....
173
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
— The emergence of multi-core and many-core processors has introduced new opportunities and challenges to EDA research and development. While the availability of increasing paral...
169
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CHI
2010
ACM
16 years 1 months ago
2010
ACM
As our technologies travel to new cultural contexts and our designs and methods engage new constituencies, both our design and analytical practices face significant challenges. We...
163
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APSEC
2009
IEEE
16 years 1 months ago
2009
IEEE
Abstract—As software evolves, engineers use regression testing to evaluate its fitness for release. Such testing typically begins with existing test cases, and many techniques h...