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DAC
2005
ACM
16 years 25 days ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
ENC
2005
IEEE
15 years 5 months ago
Hard Problem Generation for MKP
We developed generators that produce challenging MKP instances. Our approaches uses independently exponential distributions over a wide range to generate the constraint coefficien...
Maria A. Osorio, Germn Cuaya
OOPSLA
2005
Springer
15 years 5 months ago
MDAbench: a tool for customized benchmark generation using MDA
Designing component-based application that meets performance requirements remains a challenging problem, and usually requires a prototype to be constructed to benchmark performanc...
Liming Zhu, Yan Liu, Ian Gorton, Ngoc Bao Bui
PPOPP
2012
ACM
13 years 7 months ago
Deterministic parallel random-number generation for dynamic-multithreading platforms
Existing concurrency platforms for dynamic multithreading do not provide repeatable parallel random-number generators. This paper proposes that a mechanism called pedigrees be bui...
Charles E. Leiserson, Tao B. Schardl, Jim Sukha
AOSD
2007
ACM
15 years 3 months ago
Generating parallel applications for distributed memory systems using aspects, components, and patterns
Developing and debugging parallel programs particularly for distributed memory architectures is still a difficult task. The most popular approach to developing parallel programs f...
Purushotham V. Bangalore