Data center availability is critical considering the explosive growth in Internet services and people’s dependence on them. Furthermore, in recent years, sustainability has beco...
Manish Marwah, Paulo Romero Martins Maciel, Amip S...
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
Erika Gunadi, Abhishek A. Sinkar, Nam Sung Kim, Mi...
Increasing power densities in Field Programmable Gate Arrays (FPGAs) have made them susceptible to thermal problems. The advent of platform FPGAs has further exacerbated the probl...
Priya Sundararajan, Aman Gayasen, Narayanan Vijayk...
In recent years, the increasing number of processor cores and limited increases in main memory bandwidth have led to the problem of the bandwidth wall, where memory bandwidth is b...
Guangyu Sun, Christopher J. Hughes, Changkyu Kim, ...
With ever-increasing power density and cooling costs in modern high-performance systems, dynamic thermal management (DTM) has emerged as an effective technique for guaranteeing th...
Amit Kumar 0002, Li Shang, Li-Shiuan Peh, Niraj K....