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ISQED
2011
IEEE
398views Hardware» more  ISQED 2011»
14 years 7 months ago
Switching constraint-driven thermal and reliability analysis of Nanometer designs
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
Srini Krishnamoorthy, Vishak Venkatraman, Yuri Apa...
EUROPAR
2009
Springer
15 years 8 months ago
Automatic Calibration of Performance Models on Heterogeneous Multicore Architectures
Multicore architectures featuring specialized accelerators are getting an increasing amount of attention, and this success will probably influence the design of future High Perfor...
Cédric Augonnet, Samuel Thibault, Raymond N...
ASPLOS
2010
ACM
15 years 10 months ago
Conservation cores: reducing the energy of mature computations
Growing transistor counts, limited power budgets, and the breakdown of voltage scaling are currently conspiring to create a utilization wall that limits the fraction of a chip tha...
Ganesh Venkatesh, Jack Sampson, Nathan Goulding, S...
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DATE
2009
IEEE
143views Hardware» more  DATE 2009»
15 years 10 months ago
Dimensioning heterogeneous MPSoCs via parallelism analysis
—In embedded computing we face a continuously growing algorithm complexity combined with a constantly rising number of applications running on a single system. Multi-core systems...
Bastian Ristau, Torsten Limberg, Oliver Arnold, Ge...
DSD
2008
IEEE
85views Hardware» more  DSD 2008»
15 years 10 months ago
TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
Josef Strnadel