As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
Multicore architectures featuring specialized accelerators are getting an increasing amount of attention, and this success will probably influence the design of future High Perfor...
Growing transistor counts, limited power budgets, and the breakdown of voltage scaling are currently conspiring to create a utilization wall that limits the fraction of a chip tha...
Ganesh Venkatesh, Jack Sampson, Nathan Goulding, S...
—In embedded computing we face a continuously growing algorithm complexity combined with a constantly rising number of applications running on a single system. Multi-core systems...
Bastian Ristau, Torsten Limberg, Oliver Arnold, Ge...
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...