The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael ...
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
Romain Desplats, Felix Beaudoin, Philippe Perdu, N...
With the growing number of programmable processing elements in today's MultiProcessor System-on-Chip (MPSoC) designs, the synergy required for the development of the hardware...
Lei Gao, Kingshuk Karuri, Stefan Kraemer, Rainer L...
As research begins to explore potential nanotechnologies for future post-CMOS integrated systems, modeling and simulation environments must be developed that can accommodate the c...
Abstract-- The immersed boundary (IB) method is an algorithm for simulating elastic structures immersed in a fluid. The IB method can be used, for example, to simulate blood flow i...