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ICCAD
2007
IEEE
129views Hardware» more  ICCAD 2007»
15 years 11 months ago
A novel intensity based optical proximity correction algorithm with speedup in lithography simulation
Abstract—It is important to reduce the Optical Proximity Correction (OPC) runtime while maintaining a good result quality. In this paper, we obtain a better formula, which theore...
Peng Yu, David Z. Pan
ITC
1999
IEEE
89views Hardware» more  ITC 1999»
15 years 6 months ago
Defect detection using power supply transient signal analysis
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
Amy Germida, Zheng Yan, James F. Plusquellic, Fide...
117
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DATE
2003
IEEE
151views Hardware» more  DATE 2003»
15 years 7 months ago
Analysis and White-Box Modeling of Weakly Nonlinear Time-Varying Circuits
The architectural study of wireless communication systems typically requires simulations with high-level models for different analog and RF blocks. Among these blocks, frequency-t...
Petr Dobrovolný, Gerd Vandersteen, Piet Wam...
105
Voted
ISQED
2007
IEEE
146views Hardware» more  ISQED 2007»
15 years 8 months ago
Parameter-Variation-Aware Analysis for Noise Robustness
This paper studies the impact of variability on the noise robustness of logic gates using noise rejection curves (NRCs). NRCs allow noise pulses to be modeled using magnitude-dura...
Mosin Mondal, Kartik Mohanram, Yehia Massoud
171
Voted
WSC
2007
15 years 4 months ago
Monte Carlo methods in the physical sciences
I will review the role that Monte Carlo methods play in the physical sciences. They are very widely used for a number of reasons: they permit the rapid and faithful transformation...
Malvin H. Kalos