Defects not described by conventional fault models are a challenge for state-of-the-art fault diagnosis techniques. The X-fault model has been introduced recently as a modeling te...
Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji ...
We consider how simulation metamodels can be used to optimize the performance of a system that depends on a number of factors. We focus on the situation where the number of simula...
We present a method for evolving and implementing artificial neural networks (ANNs) on Field Programmable Analog Arrays (FPAAs). These FPAAs offer the small size and low power usa...
BLIF is a hardware description language designed for the hierarchical description of sequential circuits. We give a denotational semantics for BLIF-MV, a popular dialect of BLIF, t...
David A. Basin, Stefan Friedrich, Sebastian Mö...
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...