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ISQED
2003
IEEE
85views Hardware» more  ISQED 2003»
15 years 11 months ago
Static Pin Mapping and SOC Test Scheduling for Cores with Multiple Test Sets
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanja...
ISQED
2003
IEEE
119views Hardware» more  ISQED 2003»
15 years 11 months ago
System and Framework for QA of Process Design Kits
In this paper, we evaluate the dependencies between tools, data and environment in process design kits, and present a framework for systematically analyzing the quality of the des...
M. C. Scott, M. O. Peralta, Jo Dale Carothers
ITC
2003
IEEE
109views Hardware» more  ITC 2003»
15 years 11 months ago
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data
While the IEEE P1500 standards working group is on the verge of recommending a standard test interface for "non-mergeable" cores, a need was felt to adopt a standard met...
Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh,...
DATE
2010
IEEE
124views Hardware» more  DATE 2010»
15 years 11 months ago
Reuse-aware modulo scheduling for stream processors
—This paper presents reuse-aware modulo scheduling to maximizing stream reuse and improving concurrency for stream-level loops running on stream processors. The novelty lies in t...
Li Wang, Jingling Xue, Xuejun Yang
DATE
2002
IEEE
104views Hardware» more  DATE 2002»
15 years 11 months ago
A Compiler-Based Approach for Improving Intra-Iteration Data Reuse
Intra-iteration data reuse occurs when multiple array references exhibit data reuse in a single loop iteration. An optimizing compiler can exploit this reuse by clustering (in the...
Mahmut T. Kandemir