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ECBS
2007
IEEE
15 years 4 months ago
2007
IEEE
Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can ...
DATE
2006
IEEE
15 years 3 months ago
2006
IEEE
Process variations due to lens aberrations are to a large extent systematic, and can be modeled for purposes of analyses and optimizations in the design phase. Traditionally, vari...
ISLPED
2006
ACM
15 years 3 months ago
2006
ACM
All existing methods for thermal-via allocation are based on a steady-state thermal analysis and may lead to excessive number of thermal vias. This paper develops an accurate and ...
CHARME
2005
Springer
15 years 3 months ago
2005
Springer
Today, verification is becoming the dominating factor for successful circuit designs. In this context formal verification techniques allow to prove the correctness of a circuit ...
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IPSN
2005
Springer
15 years 3 months ago
2005
Springer
— We present Telos, an ultra low power wireless sensor module (“mote”) for research and experimentation. Telos is the latest in a line of motes developed by UC Berkeley to en...