y abstract, it is grounded in the experience of many markets. As I will illustrate, it explains much strategic behavior. Information spreads With a bit of effort, any technically s...
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
In this paper, we present a methodology for designing a pipeline of accelerators for an application. The application is modeled using sequential C language with simple stylization...
Importance of addressing soft errors in both safety critical applications and commercial consumer products is increasing, mainly due to ever shrinking geometries, higher-density c...
Suleyman Tosun, Nazanin Mansouri, Ercument Arvas, ...
System-on-chip and system-in-package result in increased number of I/O cells and complicated constraints for both chip designs and package designs. This renders the traditional ma...