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ATS
2009
IEEE
15 years 4 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
GLVLSI
2006
IEEE
15 years 4 months ago
2006
IEEE
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
SAMOS
2005
Springer
15 years 3 months ago
2005
Springer
This paper presents a new tool for the automatic generation of highly parallelized Finite Impulse Response (FIR) filters. In this approach we follow our PARO design methodology. P...
INFORMATICALT
2007
14 years 10 months ago
2007
Abstract. The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for ...
ICCAD
2001
IEEE
15 years 7 months ago
2001
IEEE
In this work, we present an algorithm for simultaneous template generation and matching. The algorithm profiles the graph and iteratively contracts edges to create the templates. ...