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DATE
2006
IEEE
15 years 4 months ago
2006
IEEE
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...
ICRA
2005
IEEE
15 years 3 months ago
2005
IEEE
— This paper investigates how to generate cyclic gaits for multi-bodied isolated mechanical systems whose configuration space is represented by a trivial fiber bundle. We descr...
101
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CSCLP
2005
Springer
15 years 3 months ago
2005
Springer
Problems that can be sampled randomly are a good source of test suites for comparing quality of constraint satisfaction techniques. Quasigroup problems are representatives of struc...
102
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FCCM
2003
IEEE
15 years 3 months ago
2003
IEEE
Two FPGA based implementations of random number generators intended for embedded cryptographic applications are presented. The first is a true random number generator (TRNG) whic...
CTRSA
2003
Springer
15 years 3 months ago
2003
Springer
We present extremely simple ways of embedding a backdoor in the key generation scheme of RSA. Three of our schemes generate two genuinely random primes p and q of a given size, to...