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DATE
1999
IEEE
15 years 2 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
ICCAD
1998
IEEE
15 years 2 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
SACRYPT
1998
Springer
15 years 2 months ago
1998
Springer
In this paper, we present a simple method for generating random-based signatures when random number generators are either unavailable or of suspected quality (malicious or accident...
WCRE
1997
IEEE
15 years 2 months ago
1997
IEEE
We present an approach for the generation of components for a software renovation factory. These components are generated from a context-free grammar definition that recognizes t...
DAC
1997
ACM
15 years 2 months ago
1997
ACM
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...