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101
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EURODAC
1990
IEEE
15 years 2 months ago
1990
IEEE
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
VTS
1995
IEEE
15 years 1 months ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
113
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ICCAD
1991
IEEE
15 years 1 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
117
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ICPP
1991
IEEE
15 years 1 months ago
1991
IEEE
Data decomposition is probably the most successful method for generating parallel programs. In this paper a general framework is described for the automatic generation of parallel...
SC
1991
ACM
15 years 1 months ago
1991
ACM
We present a new approach that enables compiler optimization of procedure calls and loop nests containing procedure calls. We introduce two interprocedural transformationsthat mov...