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DATE
2000
IEEE
136views Hardware» more  DATE 2000»
15 years 2 months ago
Parametric Fault Simulation and Test Vector Generation
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
Khaled Saab, Naim Ben Hamida, Bozena Kaminska
HICSS
2000
IEEE
139views Biometrics» more  HICSS 2000»
15 years 2 months ago
Capacity Payments and the Pricing of Reliability in Competitive Generation Markets
: In restructured electric power industries around the world, power pool designers have enabled generators to earn revenues consisting of energy and capacity payments. This paper d...
Angela S. Chuang, Felix F. Wu
73
Voted
ITC
1998
IEEE
95views Hardware» more  ITC 1998»
15 years 2 months ago
Native mode functional test generation for processors with applications to self test and design validation
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
Jian Shen, Jacob A. Abraham
APSEC
1996
IEEE
15 years 2 months ago
A Dialog-Oriented User Interface Generation Mechanism
Nowadays, for GUI application development, a number of interface builders make possible for the user to create user interfaces easily and UIMSs help to specify and design user int...
J. Baeg, Y. Fukazawa
ICCD
1996
IEEE
108views Hardware» more  ICCD 1996»
15 years 2 months ago
Module Generators for a Regular Analog Layout
In general, automatic layout composition techniques based on pre-designed devices facilitate the production of small IC numbers by prefabricating their basic structures. They also...
J. Kampe, C. Wisser, G. Scarbata