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101
Voted
VLSID
1997
IEEE
15 years 3 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
ECOOP
2007
Springer
15 years 2 months ago
2007
Springer
Abstract. We present Shekoosh, a novel framework for constraint-based generation of structurally complex inputs of large sizes. Given a Java predicate that represents the desired s...
ICIP
2007
IEEE
15 years 2 months ago
2007
IEEE
A motion-based side-information generation scheme with semi super-resolution for a scalable Wyner-Ziv coder framework is introduced. It is known that the performance of any Wyner-...
87
Voted
ITC
1995
IEEE
15 years 2 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
ITC
1991
IEEE
15 years 2 months ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...