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SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
15 years 4 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
EDCC
2005
Springer
15 years 4 months ago
PathCrawler: Automatic Generation of Path Tests by Combining Static and Dynamic Analysis
Abstract. We present the PathCrawler prototype tool for the automatic generation of test-cases satisfying the rigorous all-paths criterion, with a user-defined limit on the number...
Nicky Williams, Bruno Marre, Patricia Mouy, Muriel...
ICN
2005
Springer
15 years 4 months ago
Primary/Secondary Path Generation Problem: Reformulation, Solutions and Comparisons
Abstract. This paper considers the primary and secondary path generation problem in traffic engineering. We first present a standard MILP model. Since its size and integrality gap...
Quanshi Xia, Helmut Simonis
ISMIS
2005
Springer
15 years 4 months ago
Statistical Database Modeling for Privacy Preserving Database Generation
Abstract. Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively fe...
Xintao Wu, Yongge Wang, Yuliang Zheng
LCTRTS
2005
Springer
15 years 4 months ago
Composable code generation for distributed giotto
Abstract. We present a compositional approach to the implementation of hard real-time software running on a distributed platform. We explain how several code suppliers, coordinated...
Thomas A. Henzinger, Christoph M. Kirsch, Slobodan...