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KBSE
2000
IEEE
15 years 2 months ago
Systematic Generation of Dependable Change Coordination Plans for Automated Switching of Coordination Policies
Distributed information systems for decision support and e-commerce applications require coordination of multiple autonomous components and their services to accomplish a set of g...
Prasanta K. Bose, Mark G. Matthews
DFT
1997
IEEE
108views VLSI» more  DFT 1997»
15 years 2 months ago
Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Ma...
ITC
1997
IEEE
60views Hardware» more  ITC 1997»
15 years 2 months ago
Using BIST Control for Pattern Generation
A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even complete fault coverage at the same time. It take...
Gundolf Kiefer, Hans-Joachim Wunderlich
EWNLG
1993
15 years 1 months ago
Generating Grammatical and Lexical Anaphora in Assembly Instructional Texts
In this paper, we discuss the problem of generating natural anaphora in assembly instructional texts. We rst present a detailed account of grammatical and lexical anaphora and we e...
Leila Kosseim, Agnès Tutin, Richard I. Kitt...
ICCAD
1995
IEEE
120views Hardware» more  ICCAD 1995»
15 years 1 months ago
Pattern generation for a deterministic BIST scheme
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, ...