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EGICE
2006
15 years 2 months ago
Combining Two Data Mining Methods for System Identification
System identification is an abductive task which is affected by several kinds of modeling assumptions and measurement errors. Therefore, instead of optimizing values of parameters ...
Sandro Saitta, Benny Raphael, Ian F. C. Smith
84
Voted
ESWS
2006
Springer
15 years 2 months ago
Modelling Ontology Evaluation and Validation
We present a comprehensive approach to ontology evaluation and validation, which have become a crucial problem for the development of semantic technologies. Existing evaluation met...
Aldo Gangemi, Carola Catenacci, Massimiliano Ciara...
ETS
2006
IEEE
122views Hardware» more  ETS 2006»
15 years 2 months ago
Fault Identification in Reconfigurable Carry Lookahead Adders Targeting Nanoelectronic Fabrics
Online repair through reconfiguration is a particularly advantageous approach in the nanoelectronic environment since reconfigurability is naturally supported by the devices. Howe...
Wenjing Rao, Alex Orailoglu, Ramesh Karri
FPL
2006
Springer
158views Hardware» more  FPL 2006»
15 years 2 months ago
Actual-Delay Circuits on FPGA: Trading-Off Luts for Speed
FPGA devices exhibit manufacturing variability. Device ratings and Timing margins are typically used in order to cope with inter-device and intra-device variability respectively. ...
Evangelia Kassapaki, Pavlos M. Mattheakis, Christo...
COMPSAC
2001
IEEE
15 years 2 months ago
Scenario-Based Functional Regression Testing
Regression testing has been a popular quality assurance technique. Most regression testing techniques are based on code or software design. This paper proposes a scenario-based fu...
Raymond A. Paul, Lian Yu, Wei-Tek Tsai, Xiaoying B...