314 search results - page 55 / 63 » Heuristics in Conflict Resolution |
ICCAD
2009
IEEE
14 years 7 months ago
2009
IEEE
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
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ICIP
2000
IEEE
15 years 11 months ago
2000
IEEE
Rotation of the binary image of a document page for correcting the skew in the case of OCR or signature verification systems entails disfigurement of the shape of the characters, ...
ATS
2009
IEEE
15 years 4 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
ICDE
2007
IEEE
15 years 4 months ago
2007
IEEE
In this work, we propose a multi-relational concept discovery method for business intelligence applications. Multi-relational data mining finds interesting patterns that span ove...
CLEAR
2007
Springer
15 years 3 months ago
2007
Springer
Abstract. This paper presents two approaches to the problem of simultaneous tracking of several people in low resolution sequences from multiple calibrated cameras. Spatial redunda...