181 search results - page 19 / 37 » High-level area and power estimation for VLSI circuits |
ISLPED
1997
ACM
15 years 1 months ago
1997
ACM
In this paper we present a methodology and techniques for generating cycle-accurate macro-models for RTlevel power analysis. The proposed macro-model predicts not only...
73
Voted
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
Abstract—Interconnects (wires, buffers, clock distribution networks, multiplexers and busses) consume a significant fraction of total circuit power. In this work, we demonstrat...
88
Voted
GLVLSI
2003
IEEE
15 years 2 months ago
2003
IEEE
With scaling down to deep submicron and nanometer technologies, noise immunity is becoming a metric of the same importance as power, speed, and area. Smaller feature sizes, low vo...
ISLPED
2006
ACM
15 years 3 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
VTS
2002
IEEE
15 years 2 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...