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» High-level area and power estimation for VLSI circuits
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GLVLSI
2007
IEEE
194views VLSI» more  GLVLSI 2007»
15 years 1 months ago
Probabilistic maximum error modeling for unreliable logic circuits
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
Karthikeyan Lingasubramanian, Sanjukta Bhanja
66
Voted
DAC
2007
ACM
15 years 10 months ago
Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation
We present an efficient technique for finding the mean and variance of the full-chip leakage of a candidate design, while considering logic-structures and both die-to-die and with...
Khaled R. Heloue, Navid Azizi, Farid N. Najm
GLVLSI
2000
IEEE
85views VLSI» more  GLVLSI 2000»
15 years 2 months ago
Fast and accurate estimation of floorplans in logic/high-level synthesis
In many applications such as high-level synthesis (HLS) and logic synthesis and possibly engineering change order (ECO) we would like to get fast and accurate estimations of diffe...
Kia Bazargan, Abhishek Ranjan, Majid Sarrafzadeh
GLVLSI
2006
IEEE
90views VLSI» more  GLVLSI 2006»
15 years 3 months ago
Low-power clustering with minimum logic replication for coarse-grained, antifuse based FPGAs
This paper presents a minimum area, low-power driven clustering algorithm for coarse-grained, antifuse-based FPGAs under delay constraints. The algorithm accurately predicts logic...
Chang Woo Kang, Massoud Pedram
ISVLSI
2008
IEEE
104views VLSI» more  ISVLSI 2008»
15 years 4 months ago
Thermal-Aware Placement of Standard Cells and Gate Arrays: Studies and Observations
In high-performance VLSI circuits, the on-chip power densities are playing dominant role due to increased scaling of technology, increasing number of components, frequency and ban...
Prasun Ghosal, Tuhina Samanta, Hafizur Rahaman, Pa...