Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
We present an efficient technique for finding the mean and variance of the full-chip leakage of a candidate design, while considering logic-structures and both die-to-die and with...
In many applications such as high-level synthesis (HLS) and logic synthesis and possibly engineering change order (ECO) we would like to get fast and accurate estimations of diffe...
This paper presents a minimum area, low-power driven clustering algorithm for coarse-grained, antifuse-based FPGAs under delay constraints. The algorithm accurately predicts logic...
In high-performance VLSI circuits, the on-chip power densities are playing dominant role due to increased scaling of technology, increasing number of components, frequency and ban...