181 search results - page 23 / 37 » High-level area and power estimation for VLSI circuits |
VLSID
2006
IEEE
15 years 10 months ago
2006
IEEE
With increasing design complexity, as well as continued scaling of supplies, the design and analysis of power/ground distribution networks poses a difficult problem in modern IC d...
69
Voted
ARVLSI
1997
IEEE
15 years 1 months ago
1997
IEEE
The growing gap between on-chip gates and off-chip I/O bandwidth argues for ever larger amounts of on-chip memory. Emerging portable consumer technology, such as digital cameras, ...
VLSID
2007
IEEE
15 years 3 months ago
2007
IEEE
The 3-2, 4-2 and 5-2 compressors are the basic components in many applications, in particular partial product summation in multipliers. In this paper novel architectures and desig...
DFT
2004
IEEE
15 years 1 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
DSD
2008
IEEE
15 years 4 months ago
2008
IEEE
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...