As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
A high accuracy system for transistor-level static timing analysis is presented. Accurate static timing verification requires that individual gate and interconnect delays be accu...
Pawan Kulshreshtha, Robert Palermo, Mohammad Morta...
Continuous improvements in integration scale have made major microprocessor vendors to move to designs that integrate several processor cores on the same chip. Chip-multiprocessor...
The seamless and flexible interconnection of the existing and emerging protocols and networks is essential to the success of the new generation mobile applications and services. Fo...
Erkki Harjula, Jussi Ala-Kurikka, Douglas Howie, M...