4095 search results - page 303 / 819 » How to test a tree |
99
Voted
DATE
1998
IEEE
15 years 5 months ago
1998
IEEE
Built-in self-test BIST techniques modify functional hardware to give a data path the capability to test itself. The modi cation of data path registers into registers BIST resourc...
107
Voted
ACSE
1997
ACM
15 years 5 months ago
1997
ACM
One of the major difficulties with teaching the first programming course is input/output. It is desirable to show students how to input data and output results early in the course...
51
Voted
HICSS
2007
IEEE
15 years 4 months ago
2007
IEEE
Short assigned question-answering style tasks are often used as a probe to understand how users do search. While such assigned tasks are simple to test and are effective at elicit...
120
click to vote
VLSID
2000
IEEE
15 years 4 months ago
2000
IEEE
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of...
103
click to vote
AUSAI
2008
Springer
15 years 2 months ago
2008
Springer
Abstract. Bias variance decomposition for classifiers is a useful tool in understanding classifier behavior. Unfortunately, the literature does not provide consistent guidelines on...