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GECCO
2009
Springer
163views Optimization» more  GECCO 2009»
15 years 4 months ago
Dealing with inheritance in OO evolutionary testing
Most of the software developed in the world follows the object-oriented (OO) paradigm. However, the existing work on evolutionary testing is mainly targeted to procedural language...
Javier Ferrer, J. Francisco Chicano, Enrique Alba
MTV
2005
IEEE
138views Hardware» more  MTV 2005»
15 years 3 months ago
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
Paolo Bernardi, Ernesto Sánchez, Massimilia...
VTS
2002
IEEE
113views Hardware» more  VTS 2002»
15 years 2 months ago
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
Krishna Sekar, Sujit Dey
TJS
2002
136views more  TJS 2002»
14 years 9 months ago
A Virtual Test Facility for the Simulation of Dynamic Response in Materials
The Center for Simulating Dynamic Response of Materials at the California Institute of Technology is constructing a virtual shock physics facility for studying the response of vari...
Julian Cummings, Michael Aivazis, Ravi Samtaney, R...
STOC
2004
ACM
177views Algorithms» more  STOC 2004»
15 years 10 months ago
Lower bounds for linear degeneracy testing
Abstract. In the late nineties, Erickson proved a remarkable lower bound on the decision tree complexity of one of the central problems of computational geometry: given n numbers, ...
Nir Ailon, Bernard Chazelle