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DAC
2008
ACM
15 years 10 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2008
ACM
15 years 10 months ago
Daedalus: toward composable multimedia MP-SoC design
Daedalus is a system-level design flow for the design of multiprocessor system-on-chip (MP-SoC) based embedded multimedia systems. It offers a fully integrated tool-flow in which ...
Hristo Nikolov, Mark Thompson, Todor Stefanov, And...
ICSE
2008
IEEE-ACM
15 years 10 months ago
Impact analysis of database schema changes
We propose static program analysis techniques for identifying the impact of relational database schema changes upon object-oriented applications. We use dataflow analysis to extra...
Andy Maule, Wolfgang Emmerich, David S. Rosenblum
SIGSOFT
2008
ACM
15 years 10 months ago
Profile-guided program simplification for effective testing and analysis
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...
Lingxiao Jiang, Zhendong Su
ISBI
2008
IEEE
15 years 10 months ago
Integrated profiling of cell surface protein and nuclear marker for discriminant analysis
Cell membrane proteins play an important role in tissue architecture and cell-cell communication. We hypothesize that segmentation and multivariate characterization of the distrib...
Ju Han, Hang Chang, Kumari L. Andarawewa, Paul Yas...