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GLVLSI
2007
IEEE
194views VLSI» more  GLVLSI 2007»
15 years 1 months ago
Probabilistic maximum error modeling for unreliable logic circuits
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
Karthikeyan Lingasubramanian, Sanjukta Bhanja
ACL
2003
14 years 11 months ago
Recognizing Expressions of Commonsense Psychology in English Text
Many applications of natural language processing technologies involve analyzing texts that concern the psychological states and processes of people, including their beliefs, goals...
Andrew Gordon, Abe Kazemzadeh, Anish Nair, Milena ...
KDID
2004
140views Database» more  KDID 2004»
14 years 11 months ago
Mining Formal Concepts with a Bounded Number of Exceptions from Transactional Data
We are designing new data mining techniques on boolean contexts to identify a priori interesting bi-sets (i.e., sets of objects or transactions associated to sets of attributes or ...
Jérémy Besson, Céline Robarde...
BMCBI
2007
125views more  BMCBI 2007»
14 years 10 months ago
Statistical tests to compare motif count exceptionalities
Background: Finding over- or under-represented motifs in biological sequences is now a common task in genomics. Thanks to p-value calculation for motif counts, exceptional motifs ...
Stéphane Robin, Sophie Schbath, Vincent Van...
TVLSI
2008
105views more  TVLSI 2008»
14 years 10 months ago
Robust Concurrent Online Testing of Network-on-Chip-Based SoCs
Lifetime concerns for complex systems-on-a-chip (SoC) designs due to decreasing levels in reliability motivate the development of solutions to ensure reliable operation. A precurso...
Praveen Bhojwani, Rabi N. Mahapatra