4 search results - page 1 / 1 » Image Processing Techniques for Wafer Defect Cluster Identif... |
DT
2002
13 years 9 months ago
2002
MVA
2000
13 years 11 months ago
2000
The present paper proposes a new concept of image processing method based on vector representation for visual inspection test. The method was applied to detect defects and extract...
ICIP
2000
IEEE
14 years 11 months ago
2000
IEEE
In this paper, we introduce a method for estimating the statistically distinct neural responses in an sequence of functional magnetic resonance images (fMRI). The crux of our meth...
TMM
2008
13 years 10 months ago
2008
Object recognition and content-based image retrieval systems rely heavily on the accurate and efficient identification of shapes. A fundamental requirement in the shape analysis p...