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NIPS
2003
15 years 7 months ago
Nonlinear Filtering of Electron Micrographs by Means of Support Vector Regression
Nonlinear filtering can solve very complex problems, but typically involve very time consuming calculations. Here we show that for filters that are constructed as a RBF network ...
Roland Vollgraf, Michael Scholz, Ian A. Meinertzha...
137
Voted
MVA
1994
119views Computer Vision» more  MVA 1994»
15 years 6 months ago
Development of Surface Inspection Machine for Organic Photo Conductor(OPC)
The OPC is one of the most important component in the electrophotography process. So far its surface defects which degrade print quality were inspected by human-eye. We have devel...
Osamu Nakayama, Shinji Kobayashi, Katsuyuki Omura,...
CVPR
2010
IEEE
15 years 5 months ago
Exploiting Monge structures in optimum subwindow search
Optimum subwindow search for object detection aims to find a subwindow so that the contained subimage is most similar to the query object. This problem can be formulated as a fou...
Senjian An, Patrick Peursum, Wanquan Liu, Svetha V...
113
Voted
BIB
2008
88views more  BIB 2008»
15 years 5 months ago
An overview of image-processing methods for Affymetrix GeneChips
We present an overview of image-processing methods for Affymetrix GeneChips. All GeneChips are affected to some extent by spatially coherent defects and image processing has a num...
Jose M. Arteaga-Salas, Harry Zuzan, William B. Lan...
CVGIP
2006
163views more  CVGIP 2006»
15 years 5 months ago
SVD-matching using SIFT features
The paper tackles the problem of feature points matching between pair of images of the same scene. This is a key problem in computer vision. The method we discuss here is a versio...
Elisabetta Delponte, Francesco Isgrò, Franc...