This paper presents an inspection method of particle contamination for semiconductor reticles using continuous wavelet transform. Particle defect is considered as a singularity in...
Metric Labeling problems have been introduced as a model for understanding noisy data with pair-wise relations between the data points. One application of labeling problems with pa...
In this paper we present a stable automatic system for image composition, which can well control the color difference between two images, and produce a seamless composite image wit...
We present a method for picture detection in document page images, which can come from scanned or camera images, or rendered from electronic file formats. Our method uses OCR to s...
We present an image-based algorithm for interactive rendering depth-of-field effects in images with depth maps. While previously published methods for interactive depth-of-field...