104 search results - page 13 / 21 » Impact Analysis of Process Variability on Clock Skew |
ICCD
2006
IEEE
15 years 6 months ago
2006
IEEE
— As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the vol...
TCAD
2008
14 years 9 months ago
2008
Latency-insensitive protocols allow system-on-chip (SoC) engineers to decouple the design of the computing cores from the design of the intercore communication channels while follo...
DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
Variability in process parameters is making accurate timing analysis of nano-scale integrated circuits an extremely challenging task. In this paper, we propose a new algorithm for...
101
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TVLSI
2008
14 years 9 months ago
2008
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance o...
66
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HICSS
2006
IEEE
15 years 3 months ago
2006
IEEE
IT value remains a serious concern of management today, especially how it should be measured and how it is created. Although we have made significant progress at the firm and aggre...