104 search results - page 14 / 21 » Impact Analysis of Process Variability on Clock Skew |
GROUP
2007
ACM
15 years 1 months ago
2007
ACM
This paper explores the impact of enterprise-wide processes and technologies on group relations and exchanges. We examine the use of Customer Relationship Management (CRM) tools i...
VLSID
2006
IEEE
15 years 3 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
DATE
2007
IEEE
15 years 3 months ago
2007
IEEE
In this paper, we propose a novel statistical model order reduction technique, called statistical spectrum model order reduction (SSMOR) method, which considers both intra-die and...
ISQED
2009
IEEE
15 years 4 months ago
2009
IEEE
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
GLVLSI
2006
IEEE
15 years 3 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...