104 search results - page 17 / 21 » Impact Analysis of Process Variability on Clock Skew |
DATE
2003
IEEE
15 years 2 months ago
2003
IEEE
The growing impact of within-die process variation has created the need for statistical timing analysis, where gate delays are modeled as random variables. Statistical timing anal...
84
Voted
ICMLA
2009
14 years 7 months ago
2009
In sequential decision making under uncertainty, as in many other modeling endeavors, researchers observe a dynamical system and collect data measuring its behavior over time. The...
ISQED
2010
IEEE
15 years 4 months ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...
TCAD
2008
14 years 9 months ago
2008
Starting at the 65-nm node, stress engineering to improve the performance of transistors has been a major industry focus. An intrinsic stress source--shallow trench isolation (STI)...
DAC
2004
ACM
15 years 1 months ago
2004
ACM
There is an increased dominance of intra-die process variations, creating a need for an accurate and fast statistical timing analysis. Most of the recent proposed approaches assum...