20 search results - page 2 / 4 » Impact of Modern Process Technologies on the Electrical Para... |
ICCAD
2006
IEEE
14 years 3 months ago
2006
IEEE
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
DATE
2005
IEEE
13 years 12 months ago
2005
IEEE
As packet-switching interconnection networks replace buses and dedicated wires to become the standard on-chip interconnection fabric, reducing their power consumption has been ide...
GLVLSI
2006
IEEE
14 years 9 days ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
ICCAD
2003
IEEE
14 years 3 months ago
2003
IEEE
Under modern VLSI technology, process variations greatly affect circuit performance, especially clock skew which is very timing sensitive. Unwanted skew due to process variation f...
DATE
2007
IEEE
14 years 17 days ago
2007
IEEE
Global interconnect temperature keeps rising in the current and future technologies due to self-heating and the adiabatic property of top metal layers. The thermal e ects impact a...