A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara
Abstract. The paper presents a novel and efficient method to generate true random numbers on FPGAs by inducing metastability in bi-stable circuit elements, e.g. flip-flops. Meta...
We use reconfigurable hardware to construct a high throughput Bayesian computing machine (BCM) capable of evaluating probabilistic networks with arbitrary DAG (directed acyclic gr...