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ISLPED
2005
ACM
15 years 3 months ago
2005
ACM
Leakage power reduction in cache memories continues to be a critical area of research because of the promise of a significant pay-off. Various techniques have been developed so fa...
DATE
2000
IEEE
15 years 1 months ago
2000
IEEE
As the CMOS technology scaled down, the horizontal coupling capacitance between adjacent wires plays dominant part in wire load, crosstalk interference becomes a serious problem f...
DFT
2003
IEEE
15 years 2 months ago
2003
IEEE
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
ISCAS
2007
IEEE
15 years 3 months ago
2007
IEEE
- Data in conventional six transistor (6T) static random access memory (SRAM) cells are vulnerable to noise due to the direct access to the data storage nodes through the bit lines...
ICCAD
2009
IEEE
14 years 7 months ago
2009
IEEE
As VLSI technology reaches 45nm technology node, leakage power optimization has become a major design challenge. Threshold voltage (vt) assignment has been extensively studied, du...