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DT
2006
109views more  DT 2006»
14 years 9 months ago
Test Consideration for Nanometer-Scale CMOS Circuits
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
Kaushik Roy, T. M. Mak, Kwang-Ting (Tim) Cheng
TCAD
2008
118views more  TCAD 2008»
14 years 9 months ago
Variability-Aware Bulk-MOS Device Design
As CMOS technology is scaled down toward the nanoscale regime, drastically growing leakage currents and variations in device characteristics are becoming two important design chall...
Javid Jaffari, Mohab Anis
MICRO
2005
IEEE
113views Hardware» more  MICRO 2005»
15 years 3 months ago
Thermal Management of On-Chip Caches Through Power Density Minimization
Various architectural power reduction techniques have been proposed for on-chip caches in the last decade. In this paper, we first show that these power reduction techniques can b...
Ja Chun Ku, Serkan Ozdemir, Gokhan Memik, Yehea I....
ASPDAC
2006
ACM
157views Hardware» more  ASPDAC 2006»
15 years 3 months ago
Delay modeling and static timing analysis for MTCMOS circuits
- One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In this paper, we propose a delay modeling and static timing analysis (STA) methodology ta...
Naoaki Ohkubo, Kimiyoshi Usami

Publication
156views
14 years 3 months ago
Dynamic Virtual Ground Voltage Estimation for Power Gating
With the technology moving into the deep sub-100nm region, the increase of leakage power consumption necessitates more aggressive power reduction techniques. Power gating is a prom...
Hao Xu, Ranga Vemuri, Wen-Ben Jone