141 search results - page 19 / 29 » Implications of technology scaling on leakage reduction tech... |
ICCAD
2009
IEEE
14 years 7 months ago
2009
IEEE
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
TVLSI
2008
14 years 9 months ago
2008
With continued scaling into the sub-90nm regime, the role of process, voltage and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. T...
SOCC
2008
IEEE
15 years 3 months ago
2008
IEEE
First-in first-out (FIFO) memories are widely used in SoC for data buffering and flow control. In this paper, a robust ultra-low power asynchronous FIFO memory is proposed. With s...
GLVLSI
2007
IEEE
15 years 3 months ago
2007
IEEE
- The Multi-Threshold CMOS (MTCMOS) technology has become a popular technique for standby power reduction. This technology utilizes high-Vth sleep transistors to reduce subthreshol...
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SIGMOD
2002
ACM
15 years 9 months ago
2002
ACM
With the increased abilities for automated data collection made possible by modern technology, the typical sizes of data collections have continued to grow in recent years. In suc...