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GLVLSI
2008
IEEE
128views VLSI» more  GLVLSI 2008»
15 years 3 months ago
NBTI-aware flip-flop characterization and design
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
Hamed Abrishami, Safar Hatami, Behnam Amelifard, M...
IV
2007
IEEE
160views Visualization» more  IV 2007»
15 years 3 months ago
Targeted Projection Pursuit for Interactive Exploration of High- Dimensional Data Sets
High-dimensional data is, by its nature, difficult to visualise. Many current techniques involve reducing the dimensionality of the data, which results in a loss of information. ...
Joe Faith
ISCA
2010
IEEE
199views Hardware» more  ISCA 2010»
15 years 1 months ago
Use ECP, not ECC, for hard failures in resistive memories
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
Stuart E. Schechter, Gabriel H. Loh, Karin Straus,...
ISW
2009
Springer
15 years 4 months ago
F3ildCrypt: End-to-End Protection of Sensitive Information in Web Services
The frequency and severity of a number of recent intrusions involving data theft and leakages has shown that online users’ trust, voluntary or not, in the ability of third partie...
Matthew Burnside, Angelos D. Keromytis
HPCA
2011
IEEE
14 years 1 months ago
Archipelago: A polymorphic cache design for enabling robust near-threshold operation
Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely us...
Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott ...