With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
Hamed Abrishami, Safar Hatami, Behnam Amelifard, M...
High-dimensional data is, by its nature, difficult to visualise. Many current techniques involve reducing the dimensionality of the data, which results in a loss of information. ...
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
Stuart E. Schechter, Gabriel H. Loh, Karin Straus,...
The frequency and severity of a number of recent intrusions involving data theft and leakages has shown that online users’ trust, voluntary or not, in the ability of third partie...
Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely us...
Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott ...