141 search results - page 4 / 29 » Implications of technology scaling on leakage reduction tech... |
VLSID
2008
IEEE
15 years 9 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
DATE
2002
IEEE
15 years 2 months ago
2002
IEEE
We present a Dynamic VTH Scaling (DVTS) scheme to save the leakage power during active mode of the circuit. The power saving strategy of DVTS is similar to that of the Dynamic VDD...
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...
VLSID
2008
IEEE
15 years 9 months ago
2008
IEEE
Technology scaling has resulted in an exponential increase in the leakage power as well as the variations in leakage power of fabricated chips. Functional units (FUs), like Intege...
DAC
2002
ACM
15 years 10 months ago
2002
ACM
Reducing power dissipation is one of the most principle subjects in VLSI design today. Scaling causes subthreshold leakage currents to become a large component of total power diss...