525 search results - page 61 / 105 » Improved Circular Layouts |
DAC
2005
ACM
15 years 10 months ago
2005
ACM
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
ISPD
2010
ACM
15 years 4 months ago
2010
ACM
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...
CHI
1997
ACM
15 years 1 months ago
1997
ACM
Most windowing systems follow the independent overlapping windows approach, which emerged as an answer to the needs of the 1980s’ technology. Due to advances in computers and di...
120
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EOR
2007
14 years 9 months ago
2007
The two-dimensional orthogonal non-guillotine cutting problem (NGCP) appears in many industries (like wood and steel industries) and consists in cutting a rectangular master surfa...
165
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BMCBI
2010
14 years 4 months ago
2010
Background: Linking high-throughput experimental data with biological networks is a key step for understanding complex biological systems. Currently, visualization tools for large...