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» Improved Fault Analysis of Signature Schemes
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EUROCRYPT
2003
Springer
15 years 2 months ago
Nearly One-Sided Tests and the Goldreich-Levin Predicate
Abstract. We study statistical tests with binary output that rarely outputs one, which we call nearly one-sided statistical tests. We provide an efficient reduction establishing im...
Gustav Hast
CCS
2008
ACM
14 years 11 months ago
Multisignatures secure under the discrete logarithm assumption and a generalized forking lemma
Multisignatures allow n signers to produce a short joint signature on a single message. Multisignatures were achieved in the plain model with a non-interactive protocol in groups ...
Ali Bagherzandi, Jung Hee Cheon, Stanislaw Jarecki
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
15 years 9 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
ICCD
2005
IEEE
102views Hardware» more  ICCD 2005»
15 years 6 months ago
ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values
This paper proposes a response compactor, named ChiYun compactor, to compact scan-out responses in the presence of unknown values. By adding storage elements into an Xor network, ...
Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Cha...
SIGIR
2010
ACM
15 years 1 months ago
Adaptive near-duplicate detection via similarity learning
In this paper, we present a novel near-duplicate document detection method that can easily be tuned for a particular domain. Our method represents each document as a real-valued s...
Hannaneh Hajishirzi, Wen-tau Yih, Aleksander Kolcz