376 search results - page 11 / 76 » Improved Simulation of Stabilizer Circuits |
ICCAD
2007
IEEE
15 years 6 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
IPPS
1998
IEEE
15 years 2 months ago
1998
IEEE
In this communication Simulated Annealing and Genetic Algorithms, are applied to the graph partitioning problem. These techniques mimic processes in statistical mechanics and biol...
MTV
2007
IEEE
15 years 4 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
STOC
2005
ACM
15 years 10 months ago
2005
ACM
We present a new constant round protocol for non-malleable zero-knowledge. Using this protocol as a subroutine, we obtain a new constant-round protocol for non-malleable commitmen...
JCP
2008
14 years 10 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...