376 search results - page 51 / 76 » Improved Simulation of Stabilizer Circuits |
141
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IOLTS
2007
IEEE
15 years 10 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
152
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
130
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INFOCOM
2009
IEEE
15 years 11 months ago
2009
IEEE
—In current multi-channel live P2P video systems, there are several fundamental performance problems including exceedingly-large channel switching delays, long playback lags, and...
151
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ICRA
2005
IEEE
15 years 10 months ago
2005
IEEE
Abstract— We propose a control framework for the bilateral teleoperation between a single master robot and multiple cooperative slave robots with communication-delay in the maste...
112
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ICCAD
2005
IEEE
16 years 1 months ago
2005
IEEE
— Increasingly prominent variational effects impose imminent threat to the progress of VLSI technology. This work explores redundancy, which is a well-known fault tolerance techn...