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DAC
2007
ACM
15 years 11 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2003
ACM
15 years 11 months ago
Optimal integer delay budgeting on directed acyclic graphs
Delay budget is an excess delay each component of a design can tolerate under a given timing constraint. Delay budgeting has been widely exploited to improve the design quality. W...
Elaheh Bozorgzadeh, Soheil Ghiasi, Atsushi Takahas...
ICML
2000
IEEE
15 years 11 months ago
Discovering Homogeneous Regions in Spatial Data through Competition
If all features causing heterogeneity were observed, a mixture of experts approach (Jacobs et al., 1991) is likely to be superior to using a single model. When unobserved or very n...
Slobodan Vucetic, Zoran Obradovic
ICML
1999
IEEE
15 years 11 months ago
Distributed Value Functions
Many interesting problems, such as power grids, network switches, and tra c ow, that are candidates for solving with reinforcement learningRL, alsohave properties that make distri...
Jeff G. Schneider, Weng-Keen Wong, Andrew W. Moore...
ICML
1999
IEEE
15 years 11 months ago
Lazy Bayesian Rules: A Lazy Semi-Naive Bayesian Learning Technique Competitive to Boosting Decision Trees
Lbr is a lazy semi-naive Bayesian classi er learning technique, designed to alleviate the attribute interdependence problem of naive Bayesian classi cation. To classify a test exa...
Zijian Zheng, Geoffrey I. Webb, Kai Ming Ting
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