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DAC
2007
ACM
16 years 5 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
WWW
2009
ACM
16 years 4 months ago
A trust management framework for service-oriented environments
Many reputation management systems have been developed under the assumption that each entity in the system will use a variant of the same scoring function. Much of the previous wo...
William Conner, Arun Iyengar, Thomas A. Mikalsen, ...
WWW
2009
ACM
16 years 4 months ago
Enhancing diversity, coverage and balance for summarization through structure learning
Document summarization plays an increasingly important role with the exponential growth of documents on the Web. Many supervised and unsupervised approaches have been proposed to ...
Liangda Li, Ke Zhou, Gui-Rong Xue, Hongyuan Zha, Y...
WWW
2008
ACM
16 years 4 months ago
Modeling online reviews with multi-grain topic models
In this paper we present a novel framework for extracting the ratable aspects of objects from online user reviews. Extracting such aspects is an important challenge in automatical...
Ivan Titov, Ryan T. McDonald
WWW
2008
ACM
16 years 4 months ago
Characterizing typical and atypical user sessions in clickstreams
Millions of users retrieve information from the Internet using search engines. Mining these user sessions can provide valuable information about the quality of user experience and...
Narayanan Sadagopan, Jie Li