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138
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ICCAD
2005
IEEE
16 years 1 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
126
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ATS
2005
IEEE
15 years 10 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
134
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ISPD
1999
ACM
15 years 9 months ago
1999
ACM
Typical placement objectives involve reducing net-cut cost or minimizing wirelength. Congestion minimization is least understood, however, it models routability accurately. In thi...
168
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FPGA
2006
ACM
15 years 8 months ago
2006
ACM
The high unit cost of FPGA devices often deters their use beyond the prototyping stage. Efforts have been made to reduce the part-cost of FPGA devices, resulting in the developmen...
157
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DATE
2005
IEEE
15 years 7 months ago
2005
IEEE
Operating frequency of a pipelined circuit is determined by the delay of the slowest pipeline stage. However, under statistical delay variation in sub-100nm technology regime, the...